By Topic

Calibration of measurement system based on phase measurement profilometry

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shen Zuo-chun ; Sch. of Astronaut., Harbin Inst. of Technol. Harbin, Harbin, China ; Li Hua-wei ; Zhou Yan-zhou

With the phase measurement profilometry widely used, the precision phase measurement profilometry is demanded. The system was calibrated using by translating the calibration plate. Relationship between the coordinate z and phase was determined. And the coordinates (x, y, z) and pixel coordinates (m, n) relationships were determined too. We analyzed the results of each step of the standard deviation of calibration and get a high calibration accuracy. In order to further improve the calibration accuracy, we corrected the angle errors between the camera coordinate system and the actual world coordinate system. In order to verify the validity of this calibration method, we measured a ball bearing. The measurement accuracy is 0.0428+/-0.01mm.

Published in:

Optoelectronics and Microelectronics Technology (AISOMT), 2011 Academic International Symposium on

Date of Conference:

12-16 Oct. 2011