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The authors have investigated the effects of a low-temperature ZnTe buffer layer on structural and optical properties of ZnTe epilayers grown on (100) GaAs substrates by transmission electron microscopy and photoluminescence measurements. It has been found that the low-temperature ZnTe buffer layer can reduce the defects such as disordered region in the ZnTe buffer layer and suppress the dislocations at the ZnTe surface region, resulting in the formation of a high quality ZnTe epilayer grown on the low-temperature buffer layer.
Published in:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
(Volume:30
,
Issue:
2
)
Date of Publication: Mar 2012
- Page(s):
- 021508 - 021508-4
- ISSN :
- 0734-2101
- Digital Object Identifier :
- 10.1116/1.3688498
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 01 March 2012
- Issue Date :
- Mar 2012
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