Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Evaluating Stratification Alternatives to Improve Software Defect Prediction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Pelayo, L. ; Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada ; Dick, S.

Numerous studies have applied machine learning to the software defect prediction problem, i.e. predicting which modules will experience a failure during operation based on software metrics. However, skewness in defect-prediction datasets can mean that the resulting classifiers often predict the faulty (minority) class less accurately. This problem is well known in machine learning, and is often referred to as “learning from imbalanced datasets.” One common approach for mitigating skewness is to use stratification to homogenize class distributions; however, it is unclear what stratification techniques are most effective, both generally and specifically in software defect prediction. In this article, we investigate two major stratification alternatives (under-, and over-sampling) for software defect prediction using Analysis of Variance. Our analysis covers several modern software defect prediction datasets using a factorial design. We find that the main effect of under-sampling is significant at α = 0.05, as is the interaction between under- and over-sampling. However, the main effect of over-sampling is not significant.

Published in:

Reliability, IEEE Transactions on  (Volume:61 ,  Issue: 2 )