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We present a qualitative method for series resistance imaging that generates lateral current flow in solar cells without electrical contacting. The applicability of the method is demonstrated on a multicrystalline silicon solar cell, and the results are briefly discussed with respect to lifetime artifacts and injection dependence of the series resistance distribution. The method overcomes one of the major drawbacks of state-of-the-art series resistance imaging methods, which require electrical contacting for current injection or extraction. It allows for all-contactless measurements, reduces the cell breakage rate, and simplifies the measurement setup and sample handling.