By Topic

An Improved Algorithm for Test Data Generation Based on Particle Swarm Optimization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wang Jianfeng ; Inst. of Autom. Test & Control, Harbin Inst. of Technol., Harbin, China ; Jiang Shouda

The test case generation is one of key issues of combinatorial testing. In this paper, a new algorithm for test data generation based on Particle Swarm Optimization (PSO) is presented. Based on Particle Swarm Optimization, the optimization base and extended parameters are introduced. The number of the current output test data is adjusted dynamically according to the data generated before. The efficiency of the test data generation is improved effectively on the premise of ensuring the optimization of the data generated.

Published in:

Instrumentation, Measurement, Computer, Communication and Control, 2011 First International Conference on

Date of Conference:

21-23 Oct. 2011