By Topic

Application of Virtual Machine Based Taint Analysis on Multi-Dimensional Fuzzing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Zhi-yong Wu ; North Electron. Equipments Res. Inst., Beijing, China ; Xiao-juan Wang ; Hui Huang ; Lan-lan Qi

During the multi-dimensional Fuzzing technique, how to construct the influencing relationships between input elements and vulnerable statements is a key problem. This paper applies the virtual machine based taint analysis technique on multi-dimensional Fuzzing, gives detailed design and the experiment result shows the method is feasible.

Published in:

Instrumentation, Measurement, Computer, Communication and Control, 2011 First International Conference on

Date of Conference:

21-23 Oct. 2011