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Soft errors caused by radiation particles are becoming an increasingly important issue for memory reliability. Traditionally, Single Error Correction Double Error Detection (SEC-DED) codes have been used to correct soft errors. Such codes can correct one error per memory word, but as errors become more frequent they may be insufficient. More complex error correction codes (ECCs) could be used, but they typically require complex decoders which impact memory area and speed. In this paper, the use of Euclidean geometry (EG) codes for memory applications is studied. The results show that these codes, which provide powerful error correction capabilities, can be implemented efficiently in terms of area and latency.