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Stochastic Analysis of Switched-Capacitor Circuits for Sampled Data Converters

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1 Author(s)
Maffezzoni, P. ; Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy

This paper describes an original simulation-based method to derive the stochastic properties of the output noise of switched-capacitor circuits which are used in sampled-data converters. The method relies on a linear time-varying approximation of the large-signal transient response of the switched circuits. It is shown how switched-capacitor-circuit noise and quantization noise, due to the presence of harsh comparators, can be analyzed in a unified frame where the data converter is modeled as a discrete-time system.

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:31 ,  Issue: 3 )