Cart (Loading....) | Create Account
Close category search window
 

Improving path selection by handling loops in automatic test data generation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Zanjani, S.N. ; Comput. Dept., Islamic Azad Univ. Qazvin branch, Tehran, Iran ; Dehghan Takht Fuladi, M. ; Aghababa, A.B.

Generating path oriented test data is one of the most powerful methods in generating appropriate test data which selects all complete paths in Control Flow Graph (CFG) and generates appropriate data to traverse the selected paths. In path selecting phase, different paths could be selected according to loops iteration that most of them are infeasible. Because the number of loops iteration is detected dynamically through the program execution in most cases. In earlier techniques, researchers either refused to handle loops or dealt with them by simplifying; thus, no effective solutions have been represented up to now. In paths with loops, proposed algorithm firstly attempts to determine the exact number of loops iteration. Then if the iterations remain unknown, this number will be decided by the tester. This technique is executed based on symbolic evaluation and loop information. Finally, selected paths can all be traversed; moreover, with reducing the number of infeasible paths, the time of generating test data will be reduced remarkably.

Published in:

Multitopic Conference (INMIC), 2011 IEEE 14th International

Date of Conference:

22-24 Dec. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.