By Topic

A Time-Based Technique for Testing LC-Tank Oscillators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

This paper describes a new architecture that explores time-based signal-processing concepts for testing LC-tank radio-frequency (RF) oscillator circuits, and in particular, quadrature oscillators, while relying on low-frequency digital test equipment. The proposed system has two inputs that are two step-like signals with a time separation that is externally controlled. The output of the system is an amplified and digitized time separation that is a function of the time separation between the applied input steps and the oscillator output frequency characteristics. Coarse time digitization circuits are used to read the output, from which the frequency of oscillation of the oscillator is deduced. A proof-of-concept circuit is designed and fabricated in a standard 0.18-μm CMOS process. Experimental results confirm the feasibility of the proposed approach, which is demonstrated in this work with the successful on-chip measurement of 1.5 and 1.7 GHz oscillation frequencies.

Published in:

Circuits and Systems I: Regular Papers, IEEE Transactions on  (Volume:59 ,  Issue: 9 )