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Optical and micro-structural characterizations of MBE grown indium gallium nitride polar quantum dots

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9 Author(s)
ElAfandy, R.T. ; Div. of Phys. Sci. & Eng., King Abdullah Univ. of Sci. & Technol. (KAUST), Thuwal, Saudi Arabia ; Tien Khee Ng ; Yang Yang ; Dongkyu Cha
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Comparison between indium rich (27%) InGaN/GaN quantum dots (QDs) and their underlying wetting layer (WL) is performed by means of optical and structural characterizations. With increasing temperature, micro-photoluminescence (μPL) study reveals the superior ability of QDs to prevent carrier thermalization to nearby traps compared to the two dimensional WL. Thus, explaining the higher internal quantum efficiency of the QD nanostructure compared to the higher dimensional WL. Structural characterization (X-ray diffraction (XRD)) and transmission electron microscopy (TEM)) reveal an increase in the QD indium content over the WL indium content which is due to strain induced drifts.

Published in:

High Capacity Optical Networks and Enabling Technologies (HONET), 2011

Date of Conference:

19-21 Dec. 2011