Scheduled System Maintenance on December 17th, 2014:
IEEE Xplore will be upgraded between 2:00 and 5:00 PM EST (18:00 - 21:00) UTC. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Electrical properties of individual NiFe/Pt multilayer nanowires measured in situ in a scanning electron microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Elawayeb, Mohamed ; NanoLAB Centre, Department of Science and Engineering, University of Sheffield, S1 3JD, United Kingdom ; Peng, Yong ; Briston, Kevin J. ; Inkson, Beverley J.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The electrical properties of individual NiFe/Pt multilayer nanowires have been measured in situ by nanomanipulators in a scanning electron microscope. The electrical measurement of ∼50 nm diameter individual NiFe/Pt multilayer nanowires with polycrystalline microstructure shows that the nanowires have a resistivity of ∼2.2 × 10-7 Ω m (corresponding to a conductivity of ∼4.5× 106 Ω-1 m-1) and average resistance of individual NiFe-Pt interfaces of ∼0.2 Ω. The maximum failure current density of an individual NiFe/Pt nanowire was measured to be ∼9.63 × 1011 A m-2.

Published in:

Journal of Applied Physics  (Volume:111 ,  Issue: 3 )