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Mura defect is a problem in Thin Film Transistor Liquid Crystal Display (TFT LCD) panels. Many inspection methods have been utilized such as comparing the gray level or contrast but these may not show the original mura characteristics or cause of the problem. In this study we propose a method to quantize mura panel defects automatically by the shape of the interference pattern. There are three advantages to using this method: (i) decrease the loss of the liquid crystal material (ii) improve the manufacturing process (iii) save manufacturing process time.