By Topic

An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bernardi, P. ; Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy ; Ciganda, L.

This paper describes the working principle and an implementation of a low-cost tester architecture supporting volume test and diagnosis of built-in self-test (BIST)-assisted embedded memory cores. The described tester architecture autonomously executes a diagnosis-oriented test program, adapting the stimuli at run-time, based on the collected test results. In order to effectively allow the tester architecture to interact with the devices under test with an acceptable time overhead, the approach exploits a special hardware module to manage the diagnostic process. Embedded static RAMs equipped with diagnostic BISTs and IEEE 1500 wrappers were selected as case study; experimental results show the feasibility of the approach when having a field-programmable gate array available on the tester and its effectiveness in terms of diagnosis time and required tester memory with respect to traditional testers executing diagnosis procedures by means of software running on the host computer.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:61 ,  Issue: 4 )