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Wideband measurement system for on-chip ESD waveform characterisation

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5 Author(s)

In this age where new electronic designs are constantly pushing the limits of technology, there is a persistent need for better electrostatic discharge (ESD) protection. Proposed is a measurement probe architecture that can be used for on-chip ESD waveform characterisation. The probe circuit design is presented and test results show the feasibility of the proposed system. Such a measurement system provides invaluable information, aiding the electronics designer in the search for more robust chip designs.

Published in:

Electronics Letters  (Volume:48 ,  Issue: 3 )