Cart (Loading....) | Create Account
Close category search window
 

AC losses of AC superconducting cable due to transport current in external AC magnetic field

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

Transport current AC losses of superconducting cables of the (6+1) configuration (6 AC superconducting multifilamentary strands bundled around a CuNi center wire) and the single strand composing the cable were measured in an AC external magnetic field. The measured AC loss data of the cables of different twist pitches and directions were compared with those of the strand. It was shown that the transport current AC losses of the cables were affected by the twist directions and pitches of the cables. A theoretical model to evaluate the AC loss due to transport current was derived. In the model, the effect of the longitudinal magnetic field subjected to the strands and the current density vs. electric field characteristics of the strand were taken into consideration. Our theoretical model well explains the measured characteristics of the cable.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:7 ,  Issue: 2 )

Date of Publication:

June 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.