Close category search window
 

Solution-processable random carbon nanotube networks for thin-film transistors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Qingqing Gong ; Inst. for Nanoelectron., Techinsche Univ. Munchen, Munich, Germany ; Albert, E. ; Fabel, B. ; Abdellah, A.
more authors

We report a straightforward process to fabricate carbon nanotube field-effect transistors based on random nanotube networks. This solution-based approach is simple, fast and reliable, which can be applied to printed electronics. We also investigated the transistor performance as a function of nanotube density, content of metallic nanotubes, and channel geometry. Our experiments show that increase of nanotube density results in consistent improvement of carrier mobility, until a threshold density is achieved. Finally, a simple percolation model based on the Monte Carlo method has been developed for simulating the electrical characteristics of the devices. The model offers a basis for further optimization of carbon nanotube network devices.

Published in:
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on

Date of Conference: 15-18 Aug. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.