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Electrical resistance response evaluation of semiconducting single-walled carbon nanotube film for X-ray sensing

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2 Author(s)
Qingsheng Kang ; Department of Systems Design Engineering, University of Waterloo, Ontario, N2L 3G1, Canada ; John T W Yeow

The electrical resistance responses of a semiconducting single-walled carbon nanotube (SWCNT) film irradiated by 6MV and 15MV energy X-rays were evaluated. Results indicate that the dynamic responses exhibit fluctuations which may be an intrinsic feature of SWCNT networks due to the large number of interconnections between individual SWCNTs. The average resistance-dose rate relations of the SWCNT network are quasi-linear and can be used for dosimetry measurements in medical radiation applications.

Published in:

Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on

Date of Conference:

15-18 Aug. 2011