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Investigation of Low Dose Rate and Bias Conditions on the Total Dose Tolerance of a CMOS Flash-Based FPGA

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8 Author(s)
Rezgui, S. ; Microsemi Corp., Mountain View, CA, USA ; Wilcox, E.P. ; Poongyeub Lee ; Carts, M.A.
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TID test results of CMOS Flash-based FPGAs in gamma-rays are presented. The use of realistic low dose-rates and oriented bias-conditions are shown to extend the FPGA TID tolerance. Implications to qualification methods and to most of the new CMOS technologies are noted.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:59 ,  Issue: 1 )

Date of Publication:

Feb. 2012

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