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Competitive Technical Intelligence Analysis Based on Patents Coupling

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3 Author(s)
Sun Taotao ; Sch. of Manage. & Econ., Beijing Inst. of Technol., Beijing, China ; Liu Yun ; Wang Wenping

We have explored the extension of cross mapping techniques to visualizing of collections of patents that cover a technological specialty. We first present a network model of collections of patent records and discuss this model and its application to mapping Competitive Technical Intelligence in patents. The usefulness of these mapping and visualization techniques is demonstrated using a collection of patent abstracts gathered from the USPTO that cover the subject of DVD optical pickup technology.

Published in:

Knowledge Acquisition and Modeling (KAM), 2011 Fourth International Symposium on

Date of Conference:

8-9 Oct. 2011