Cart (Loading....) | Create Account
Close category search window
 

Adaptive Mesh Generation Method Utilizing Magnetic Flux Lines in Two-Dimensional Finite Element Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Matsutomo, S. ; Niihama Nat. Coll. of Technol., Niihama, Japan ; Noguchi, S. ; Yamashita, H.

To solve electromagnetic field problems by the finite element method, it is necessary for a user to make a mesh in preprocess. However, the made mesh is usually different from that made by the other users, since it depends on the user's experience and knowledge. The mesh strongly affects the accuracy of the analysis result. The adaptive finite element method has been researched in order to address this problem. In this paper, we propose a new mesh generation method utilizing magnetic flux lines in two-dimensional electromagnetic field problem. Utilizing the magnetic flux lines computed with a rough mesh, it is possible to distribute elements with different densities suitable for the electromagnetic field distribution.

Published in:

Magnetics, IEEE Transactions on  (Volume:48 ,  Issue: 2 )

Date of Publication:

Feb. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.