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Experimental determination of current spill-over and its effect on the efficiency droop in InGaN/GaN blue-light-emitting-diodes

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10 Author(s)
Ahn, Byung-Jun ; Department of Physics, Kongju National University, Kongju, Chungnam 314-701, South Korea ; Kim, Tae-Soo ; Dong, Yanqun ; Hong, Moon-Taek
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We report the experimental determination of current spill-over in InGaN/GaN blue light emitting diodes by measuring the change in the forward current generated by a resonant excitation. To quantify accurately, the absorption of the laser as a function of the forward current was also determined. Two samples that have clearly different behavior of efficiency droop were compared to clarify the relationship between the current spill-over and the efficiency droop. We conclude that the carrier spill-over does occur and can be a significant cause for the efficiency droop but cannot single-handedly account for the efficiency droop.

Published in:

Applied Physics Letters  (Volume:100 ,  Issue: 3 )

Date of Publication:

Jan 2012

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