Close category search window
 

L2 Sampled signal reconstruction with causality constraints - Part I: Setup and solutions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Meinsma, G. ; Dept. of Appl. Math., Univ. of Twente, Enschede, Netherlands ; Mirkin, L.

This paper studies the problem of reconstructing an analog signal from its sampled measurements, in which the sampler (acquisition device) is given and the reconstructor (interpolator/hold) is the design parameter. We formulate this problem as an L2 (Wiener/Kalman filtering like) optimization problem and place the main emphasis on a systematic incorporation of causality constraints into the design procedure. Specifically, the optimization problem is solved under the constraint that the interpolation kernel is l-causal for a given I ∈ N, i.e., that its impulse response is zero in the time interval ( -∞, -Ih), where h is the sampling period. We present a closed-form state-space solution of the problem, whose computational complexity does not depend on I and which can be efficiently calculated and implemented.

Published in:
Signal Processing, IEEE Transactions on  (Volume:60 ,  Issue: 5 )

Date of Publication: May 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.