Referenced Items are not available for this document.
In this paper, we report the first demonstration of CMOS-integrated racetrack memory. The devices measured are complete memory cells integrated into the back end of line of IBM 90 nm CMOS. We show good integration yield across 200 mm wafers. With magnetic field-assist, we demonstrate current-driven read and write operations on cells within a 256-cell CMOS-integrated array.
Published in:
Electron Devices Meeting (IEDM), 2011 IEEE International
Date of Conference: 5-7 Dec. 2011
- Page(s):
- 24.3.1 - 24.3.4
- ISSN :
- 0163-1918
- E-ISBN :
- 978-1-4577-0504-5
- Print ISBN:
- 978-1-4577-0506-9
- INSPEC Accession Number:
- 12504282
- Conference Location :
- Washington, DC
- Digital Object Identifier :
- 10.1109/IEDM.2011.6131604
- Product Type:
- Conference Publications
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