Cart (Loading....) | Create Account
Close category search window
 

Device circuit co-design using classical and non-classical III–V Multi-Gate Quantum-Well FETs (MuQFETs)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Lu Liu ; Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA ; Saripalli, V. ; Narayanan, V. ; Datta, S.

This paper presents ultra low-power reconfigurable logic and single-electron memory architecture to enable sub-300 mV VCC operation using classical and non-classical (NC) III-V Multi-Gate Quantum Well Field Effect Transistors (MuQFETs). A strained In0.7Ga0.3As quantum-well based classical multi-gate FET and an In0.7Ga0.3As MuQFET operating in Coulomb-blockade mode with tunable tunnel barrier are experimentally demonstrated. Reconfigurable Binary Decision Diagram (BDD) logic and single-electron SRAM implementations based on III-V MuQFETs are demonstrated. Using device models well calibrated to experiments, we show 50% reduction in minimum-energy for logic, and 75× reduction in dynamic power for memory at equivalent performance over Si CMOS logic.

Published in:

Electron Devices Meeting (IEDM), 2011 IEEE International

Date of Conference:

5-7 Dec. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.