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Analytical modeling of Single Event Transients propagation in combinational logic gates

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5 Author(s)
Gili, X. ; Grup de Sist. Electron., Univ. de les Illes Balears, Palma de Mallorca, Spain ; Barcelo, S. ; BarceloĢ, S. ; Bota, S.A.
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We present a Single Event Transient (SET) propagation model that can be used to categorize the propagation likelihood of a given noise waveform trough a logic gate. This analysis is key to predict if a SET induced within a combinational block is capable of causing a SEU. The model predicts the output noise characteristics given the input noise waveform for each gate, and is applied to a 65-nm technology library. These noise transfer curves have a relatively simple analytical expression suitable for an easy adoption within CAD tools. Comparison between simulations and model show a good agreement for a commercial 65 nm technology.

Published in:

Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Date of Conference:

19-23 Sept. 2011