Referenced Items are not available for this document.
We designed a phase-locked loop (PLL) operating at 200 MHz using 0.2 μm fully depleted silicon-on-insulator (SOI) technology. By SPICE simulation with an appropriate single-event transient (SET) model, we achieved a radiation-hardened PLL that does not cause a SET upset upon ion irradiation with a linear energy transfer (LET) of 50 MeV-cm2/mg at an areal penalty of 75%.
Published in:
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Date of Conference: 19-23 Sept. 2011
- Page(s):
- 150 - 155
- ISSN :
- 0379-6566
- Print ISBN:
- 978-1-4577-0585-4
- INSPEC Accession Number:
- 12591638
- Conference Location :
- Sevilla
- Digital Object Identifier :
- 10.1109/RADECS.2011.6131388
- Product Type:
- Conference Publications
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