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Investigations of single event effects with heavy ions of energies up to 1.5 GeV/n

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16 Author(s)

The ESA SEU-Monitor, a DDR2 SDRAM and a power MOSFET have been irradiated at GSI with ions of energies from 80 to 1500 MeV/n. The results are compared to low energy (<; 50 MeV/n) data.

Published in:

Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Date of Conference:

19-23 Sept. 2011

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