Cart (Loading....) | Create Account
Close category search window
 

More accurate pinhole camera calibration with imperfect planar target

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Strobl, K.H. ; German Aerosp. Center (DLR), Inst. of Robot. & Mechatron., Germany ; Hirzinger, G.

This paper presents a novel approach to camera calibration that improves final accuracy with respect to standard methods using precision planar targets, even if now inaccurate, unmeasured, roughly planar targets can be used. The work builds on a recent trend in camera calibration, namely concurrent optimization of scene structure together with the intrinsic camera parameters [4, 8, 1]. A novel formulation is presented that allows maximum likelihood estimation in the case of inaccurate targets, as it extends the camera extrinsic parameters into a tight parametrization of the whole scene structure. It furthermore observes the special characteristics of multi-view perspective projection of planar targets. Its natural extensions to stereo camera calibration and hand-eye calibration are also presented. Experiments demonstrate improvements in the parametrization of the camera model as well as in eventual stereo reconstruction.

Published in:

Computer Vision Workshops (ICCV Workshops), 2011 IEEE International Conference on

Date of Conference:

6-13 Nov. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.