Referenced Items are not available for this document.
Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.
Published in:
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Date of Conference: 6-9 Nov. 2011
- Page(s):
- 71 - 75
- Print ISBN:
- 978-1-4577-0862-6
- INSPEC Accession Number:
- 12488406
- Conference Location :
- Dubrovnik
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