Skip to Main Content
Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.
Date of Conference: 6-9 Nov. 2011