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A complete test strategy based on interacting and hierarchical FSMs

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2 Author(s)
Fummi, F. ; Dipt. di Elettronica e Inf., Politecnico di Milano, Italy ; Sciuto, D.

Control-dominated architectures are usually specified, in a hardware description language (HDL), by means of a composition of FSMs. This paper presents two FSM-based models which can be extracted from a Statechart or a HDL description. Such models are compared to the description of the device at the different abstraction levels of a standard synthesis flow. This comparison simplifies the testing problem producing a complete testing strategy that uses functional information to perform scan insertion, redundancies removal and test pattern generation even for devices which cannot be satisfactorily analyzed at the gate level

Published in:

Circuits and Systems, 1997. ISCAS '97., Proceedings of 1997 IEEE International Symposium on  (Volume:4 )

Date of Conference:

9-12 Jun 1997