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Probabilistic fault location using erroneous measurement devices

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4 Author(s)
Woolley, N.C. ; Univ. of Manchester, Manchester, UK ; Avendano-Mora, M. ; Milanovic, J.V. ; Woolley, A.P.

This paper presents a new robust method for probabilistically estimating the fault location during a voltage sag using a set of arbitrarily accurate selection of monitors located throughout a distribution network. The method uses statistical analysis to solve the fault location equations and find the most likely location for the fault location. The method draws on and advances existing impedance based fault location algorithms. The presented method is practical, using erroneous measurement data which is both available now, and expected to be available in future smart distribution networks.

Published in:

Smart Measurements for Future Grids (SMFG), 2011 IEEE International Conference on

Date of Conference:

14-16 Nov. 2011