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Long-Term Thermal Overstressing of Computers

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2 Author(s)
Kirk A. Gray ; Accelerated Reliability Solutions ; Michael Pecht

Significant opportunities exist to reduce costs in the design, manufacture, and operation of systems by using temperatures higher than specified in testing systems' reliability. The authors share the findings and observations of an experimental study in which they subjected operating computers to high steady-state temperatures and thermal cycling well beyond their design specifications. The results suggest that significant cost savings can be realized without compromising reliability.

Published in:

IEEE Design & Test of Computers  (Volume:28 ,  Issue: 6 )