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A leakage-current-recycling phase-locked loop in 65nm CMOS technology

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3 Author(s)
I-Ting Lee ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Yun-Ta Tsai ; Shen-Iuan Liu

A leakage-current-recycling technique is presented for phase-locked loops (PLLs) in nanoscale CMOS technology. The leakage current of the PMOS capacitor in a PLL is recycled to supply the power for a voltage-controlled oscillator, a divider and a dual-mode phase-frequency detector. This PLL is fabricated in a 65nm CMOS technology. The measured peak-to-peak jitter and rms jitter of this PLL at 640MHz are 52.2ps and 9.6ps, respectively. Its power consumption is 1mW for a 1.2V supply voltage.

Published in:

Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian

Date of Conference:

14-16 Nov. 2011