Close category search window
 

New reader anti-collision algorithm for dense RFID environments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Meguerditchian, C. ; Dept. of Comput. Sci., American Univ. of Beirut, Beirut, Lebanon ; Safa, H. ; El-Hajj, W.

In dense Radio Frequency Identification environments, several readers are placed in the same area to scan a large number of tags covering a wide distance range. The placement of the RFID elements may result in several types of collisions. This paper proposes a new distributed multi-channel algorithm to solve the reader collision problems in dense RFID environments. The proposed algorithm aims at minimizing the identification delay, collision probabilities, and network overheads. We have evaluated the performance of the proposed approach and compared it to several reader collision solutions found in the literature such as NFRA, Dica and McMac. The results show that the proposed approach reduces reader collisions while minimizing the total interrogation time and the network overheads.

Published in:
Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on

Date of Conference: 11-14 Dec. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.