Cart (Loading....) | Create Account
Close category search window
 

Statistical Fault Localization via Semi-dynamic Program Slicing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Rongwei Yu ; Comput. Sch., Key Lab. of Aerosp. Inf. Security & Trust Comput., Wuhan Univ., Wuhan, China ; Lei Zhao ; Lina Wang ; Xiaodan Yin

Fault localization is a critical step of software debugging. We present a statistical fault localization approach via semi-dynamic slicing in this paper. In our technique, we first conduct the execution flow graph based on both the coverage information and static control-flow-graph to model the executions approximately. Second, we use the backward slicing to analyze the dependence relationships between execution statements and execution results, obtain sliced statements and calculate the coverage statistics. At last, we calculate the fault suspiciousness according to Tarantula, a classic approach of statistical fault localization. Controlled experiments are setup on the Siemens subjects, and the results are promising.

Published in:

Trust, Security and Privacy in Computing and Communications (TrustCom), 2011 IEEE 10th International Conference on

Date of Conference:

16-18 Nov. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.