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This article presents a novel technique for the generation of test set in a reversible quantum circuit. The algorithms are developed to derive the automatic test set (ATS) for the detection of all partial missing-gate faults, all single missing gate faults and multiple missing gate faults in an (n x n) reversible circuit implemented with k-CNOT gates. Experimental results on some benchmark circuits are also reported.
Date of Conference: 19-21 Dec. 2011