Referenced Items are not available for this document.
This article presents a novel technique for the generation of test set in a reversible quantum circuit. The algorithms are developed to derive the automatic test set (ATS) for the detection of all partial missing-gate faults, all single missing gate faults and multiple missing gate faults in an (n x n) reversible circuit implemented with k-CNOT gates. Experimental results on some benchmark circuits are also reported.
Published in:
Electronic System Design (ISED), 2011 International Symposium on
Date of Conference: 19-21 Dec. 2011
- Page(s):
- 200 - 205
- Print ISBN:
- 978-1-4577-1880-9
- INSPEC Accession Number:
- 12489543
- Conference Location :
- Kochi, Kerala
- Digital Object Identifier :
- 10.1109/ISED.2011.69
- Product Type:
- Conference Publications
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