Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Debugging and testing features of the dataflow parallel computing system components and devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Levchenko, N.N. ; Inst. for Design Problems in Microelectron., Moscow, Russia ; Okunev, A.S. ; Yakhontov, D.E. ; Zmejev, D.N.

The paper describes the new tools for dynamic display of the computational process for modeling a dataflow parallel computing system that implements non-traditional architecture. These tools allow evaluating the effectiveness of program and localization functions during the task.

Published in:

Design & Test Symposium (EWDTS), 2011 9th East-West

Date of Conference:

9-12 Sept. 2011