Cart (Loading....) | Create Account
Close category search window
 

Planarity-enforcing higher-order graph cut

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Weibel, T. ; Centre de Rech. en Autom. de Nancy, Nancy-Univ., Vandoeuvre-les-Nancy, France ; Daul, C. ; Wolf, D. ; Rösch, R.

When image primitives cannot be robustly extracted, the estimation of a perspective transformation between overlapping images can be formulated as a markov random field (MRF) and minimized efficiently using graph cuts. For well contrasted images with low noise level, a first order MRF leads to an accurate and robust registration. With increasing noise however, the registration quality decreases rapidly. This contribution presents a novel algorithm that enforces planarity (as required for perspective transformations) as a soft constraint by adding higher-order cliques to the energy formulation. Results show that for low levels of Gaussian noise (standard deviation σn ϵ [0,4]), the algorithm performs comparably to the standard first order formulation. For increasing levels of noise (σn ϵ [5,12]), the found solution is roughly twice as accurate (deviation of ≈2 pixels on average compared to ≈4 pixels for σn = 10).

Published in:

Image Processing (ICIP), 2011 18th IEEE International Conference on

Date of Conference:

11-14 Sept. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.