By Topic

3D surface registration using Z-SIFT

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Lulu He ; EECS Dept., Northwestern Univ., Evanston, IL, USA ; Sen Wang ; Pappas, T.N.

We present a Z-SIFT based 3D surface registration algorithm that utilizes the depth information enhanced SIFT features to make initial alignment and the 2D feature weighted Iterative Closest Point (ICP) algorithm to realize accurate registration. The combination of SIFT features and depth information extracts faithful corresponding points between the 2D images and provides good coarse alignment for the 3D surfaces. The 2D feature weighted ICP also outperforms the naive ICP algorithm in terms of speed and accuracy. We use this approach in the context of multiple view alignment for 3D scanners. Experimental results with real objects and human faces indicate the effectiveness of the proposed approach.

Published in:

Image Processing (ICIP), 2011 18th IEEE International Conference on

Date of Conference:

11-14 Sept. 2011