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A Robust Solution for Embedded Memory Test and Repair

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5 Author(s)

This paper presents a robust solution for test and repair of embedded memories. The STAR (Self-Test and Repair) Memory System solution is developed within Synopsys Design Ware allowing users to create, integrate and verify embedded memory test and repair IP in system on chips. The key components and features of the SMS are discussed.

Published in:

2011 Asian Test Symposium

Date of Conference:

20-23 Nov. 2011