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The following topics are dealt with: clock testing; timing testing; power aware testing; defect based test technique; online testing; microprocessor testing; 3D IC testing; fault diagnosis; post-silicon debug; test compression; test quality improvement; RF signal testing; mixed signal testing; test automation; advanced memory test technique; DFT solution; BIST; nanoscale technology; 3D integrated circuit yield; 3D integrated circuit design; low power design; embedded tutorial testability; cryptographic hardware; hardware Trojan detection; and system level testing.

Published in:

Test Symposium (ATS), 2011 20th Asian

Date of Conference:

20-23 Nov. 2011