Cart (Loading....) | Create Account
Close category search window
 

Effects of atomic layer deposited thin films on dye sensitized solar cell performance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Campbell, Jonathan A. ; School of Chemical Sciences and Engineering, The University of NSW, Sydney, NSW 2052, Australia ; deBorniol, Mervyn ; Mozer, Attila J. ; Evans, Peter J.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.3670397 

The application of thin titania films by atomic layer deposition on top of a low temperature nanoparticulate TiO2 electrode was found to enhance the performance of dye sensitized solar cells. Dynamic measurements of photoinduced charge extraction showed that the atomic layer deposited top coat increased the electron lifetime at the same electron density. This was attributed to an increased electron trap concentration, which resulted in slower charge transport and increased charge carrier lifetimes.

Published in:

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films  (Volume:30 ,  Issue: 1 )

Date of Publication:

Jan 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.