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The following topics are dealt with: quality electronic design; packaging; signal integrity; analog IC design; efficient testing; high performance memory; logic circuit; MEMS; biochips; on-chip interconnection; statistical timing; leakage analysis; noise analysis; fault detection; fault correction; nanoelectronic device; VLSI architecture; sensor; and display.

Published in:

Quality Electronic Design (ASQED), 2011 3rd Asia Symposium on

Date of Conference:

19-20 July 2011