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Browse Journals & Magazines > Micro & Nano Letters, IET ...> Volume:6 Issue:12 Help

Tip and sample flexibility effects on tapping mode (amplitude modulation) AFM measurements

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2 Author(s)
Pishkenari, H.N. ; Nano-Robot. Lab., Sharif Univ. of Technol., Tehran, Iran ; Meghdari, A.

This Letter is devoted to the investigation of the tip, substrate and particle flexibility effects on the elastic deformation, the maximum repulsive force and the topography images in tapping mode (amplitude modulation) atomic force microscopy (TM-AFM). Several quantitative comparisons among the different models are presented and the effects of the elastic deformations on TM-AFM measurement are investigated.

Published in:
Micro & Nano Letters, IET  (Volume:6 ,  Issue: 12 )

Date of Publication: December 2011

Page(s):
1023 - 1028
ISSN :
1750-0443
INSPEC Accession Number:
12425456
Digital Object Identifier :
10.1049/mnl.2011.0540
Product Type:
Journals & Magazines
Date of Current Version :
26 December 2011
Issue Date :
December 2011
Sponsored by :
Institution of Engineering and Technology

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