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Tip and sample flexibility effects on tapping mode (amplitude modulation) AFM measurements

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2 Author(s)
Pishkenari, H.N. ; Nano-Robot. Lab., Sharif Univ. of Technol., Tehran, Iran ; Meghdari, A.

This Letter is devoted to the investigation of the tip, substrate and particle flexibility effects on the elastic deformation, the maximum repulsive force and the topography images in tapping mode (amplitude modulation) atomic force microscopy (TM-AFM). Several quantitative comparisons among the different models are presented and the effects of the elastic deformations on TM-AFM measurement are investigated.

Published in:

Micro & Nano Letters, IET  (Volume:6 ,  Issue: 12 )