Cart (Loading....) | Create Account
Close category search window
 

PolyMethyl Methacrylate Thin-Film-Based Field Emission Microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Yonghai Sun ; Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada ; Jaffray, D.A. ; Chen, Liang-Yih ; Yeow, J.T.W.

A field emission microscope (FEM) is a useful tool for investigating molecular surface structures. Conventional FEMs suffer from poor image contrast level and low sensitivities when low-energy electron beams are applied. In this article, a new anode material is employed to improve the FEM imaging performance. We demonstrate that the device has the capability of clearly capturing images of facet boundaries of crystal structures at the tip of a zinc oxide (ZnO) nanowire as defect sites on a Polymethyl methacrylate (PMMA) film that is exposed to electron beams. The clear image of facet boundaries has not been reported in conventional FEM images.

Published in:

Nanotechnology, IEEE Transactions on  (Volume:11 ,  Issue: 3 )

Date of Publication:

May 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.