Close category search window
 

Globally optimal robust control of large scale sheet and film processes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
VanAntwerp, J.G. ; Illinois Univ., Urbana, IL, USA ; Braatz, R.D. ; Sahinidis, N.V.

Improved multivariable control of sheet and film processes can mean significant reductions in material and energy consumption, greater production rates for existing equipment, improved product quality, elimination of product rejects, and reduced energy consumption. One of the main weaknesses of modern sheet and film process control approaches is their inability to explicitly account for model inaccuracies. Here we develop a novel computational approach for designing controllers for large scale sheet and film processes that addresses model inaccuracy in a globally optimal manner. This approach is computationally feasible for industrial sheet and film processes (up to 500 inputs and outputs)

Published in:
American Control Conference, 1997. Proceedings of the 1997  (Volume:3 )

Date of Conference: 4-6 Jun 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.