Cart (Loading....) | Create Account
Close category search window
 

Semi-global stabilization for the Buck-Buck converter via exact tracking error dynamics passive output feedback

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Oliver-Salazar, M. ; Coordinacion de Mecatronica, Centro Nac. de Investig. y Desarrollo Tecnol., Cuernavaca, Mexico ; Sira-Ramirez, H.

We demonstrate that for the Buck-Buck switched power DC-to-DC converter, a linear-time-varying state feedback control, based on exact tracking error dynamics passive output feedback, semi-globally stabilizes the tracking error to zero. The dynamic average model of the Buck-Buck converter is used as it conforms a special “energy managing” structure including an invariant field, a dissipative field, an external power source field and a control field. For this kind of structure, a natural dissipation matching condition between the dissipative field and the control field must be satisfied for the simple proposed feedback scheme to be applicable.

Published in:

Electrical Engineering Computing Science and Automatic Control (CCE), 2011 8th International Conference on

Date of Conference:

26-28 Oct. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.