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As millimeter-wave applications grow there is a corresponding need for device and circuit parameter extraction in those wider frequency ranges where measurement sensitivities and uncertainties are discussed less often. For the case of S-parameter-based extractions, examples will be studied showing how sensitivities and uncertainties in different scenarios affect the extracted results. In particular, hardware-related uncertainties will be emphasized in contrast to previous work and we will look at how uncertainty behavior in many disparate frequency ranges can impact a high frequency extraction. The effects of correlations and cascading uncertainties will also be discussed. The work focuses on low frequency to 120 GHz measurements covering devices for some 60 GHz, E band, and higher mm-wave applications.
Date of Conference: 7-9 Nov. 2011