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A Highly Scalable Interface Fuse for Advanced CMOS Logic Technologies

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5 Author(s)
Li-Yu Yang ; Inst. of Electron. Eng., Nat. Tsing-Hua Univ., Hsinchu, Taiwan ; Min-Che Hsieh ; Jheng-Sin Liu ; Yung-Wen Chin
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In this letter, we propose a novel interface fuse (iFuse) for low-power electrically programmable fuses in advanced CMOS applications. With an offset-landed metal-to-contact or contact-to-polysilicon structure, the iFuse can be programmed by substantially reduced current as compared to conventional fuses. A diagonal contact layout and the optical pattern correction scheme can further improve the cell stability as well as its programming characteristics.

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Electron Device Letters, IEEE  (Volume:33 ,  Issue: 2 )